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Title:
On the impact of ionizing and non-ionizing irradiation damage on security microcontrollers in CMOS technology
Authors: Theresa Krüger
Abstract:The possible effects of irradiation on security controllers implemented in CMOS technology are studied. First, the decrease of the effectiveness of a light sensor/detector as countermeasure against laser fault injection is analysed. Second, the use of irradiation as fault injection method is proposed.
ePrint: https://eprint.iacr.org/2024/396
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