Welcome to the resource topic for 2024/332
Title:
Leakage-Tolerant Circuits
Authors: Yuval Ishai, Yifan Song
Abstract:A leakage-resilient circuit for f:\{0,1\}^n\to\{0,1\}^m is a randomized Boolean circuit C mapping a randomized encoding of an input x to an encoding of y=f(x), such that applying any leakage function L\in \cal L to the wires of C reveals essentially nothing about x. A leakage-tolerant circuit achieves the stronger guarantee that even when x and y are not protected by any encoding, the output of L can be simulated by applying some L'\in \cal L to x and y alone. Thus, C is as secure as an ideal hardware implementation of f with respect to leakage from \cal L.
Leakage-resilient circuits were constructed for low-complexity classes \cal L, including (length-t output) \mathcal{AC}0 functions, parities, and functions with bounded communication complexity. In contrast, leakage-tolerant circuits were only known for the simple case of probing leakage, where L outputs the values of t wires in C.
We initiate a systematic study of leakage-tolerant circuits for natural classes \cal L of global leakage functions, obtaining the following main results.
Leakage-tolerant circuits for depth-1 leakage. Every circuit C_f for f can be efficiently compiled into an \cal L-tolerant circuit C for f, where \cal L includes all leakage functions L that output either t parities or t disjunctions (alternatively, conjunctions) of any number of wires or their negations. In the case of parities, our simulator runs in 2^{O(t)} time. We provide partial evidence that this may be inherent.
Application to stateful leakage-resilient circuits. Using a general transformation from leakage-tolerant circuits, we obtain the first construction of stateful t-leakage-resilient circuits that tolerate a continuous parity leakage, and the first such construction for disjunction/conjunction leakage in which the circuit size grows sub-quadratically with t. Interestingly, here we can obtain \mathtt{poly}(t)-time simulation even in the case of parities.
ePrint: https://eprint.iacr.org/2024/332
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