Welcome to the resource topic for 2022/172
Title:
A remark on NIST SP 800-22 serial test
Authors: Corina-Elena Bogos, Razvan Mocanu, Emil Simion
Abstract:This paper represents a cumulative review of the serial statistical test over the canonical values used in testing and freely generated values. Also in this paper, we study by simulation, the variation of second type error, depending on certain factors: the range of p1,the length of the bit string represented by n and the value of m-bit pattern.
ePrint: https://eprint.iacr.org/2022/172
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