[Resource Topic] 2014/870: Dynamic Behavior of RS latches using FIB processing and probe connection

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Title:
Dynamic Behavior of RS latches using FIB processing and probe connection

Authors: Naoya Torii, Dai Yamamoto, Masahiko Takenaka, Tsutomu Matsumoto

Abstract:

PUF (Physically Unclonable Function) technologies attract attention as a candidate to prevent counterfeit chips. A latch PUF is known as a high performance PUF among various types of proposed PUFs. In this paper we describe an experiment on a dynamic attack to a latch PUF consisting of RS latches, such as measuring the latch output by a probe connection after a FIB (Focused Ion Beam) processing. As a result, we confirmed that the latch PUF using the RS latch has a tolerance for the dynamic analysis, because the RS latch output was influenced and changed by the FIB processing in our experiment.

ePrint: https://eprint.iacr.org/2014/870

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