[Resource Topic] 2004/018: Corrections of the NIST Statistical Test Suite for Randomness

Welcome to the resource topic for 2004/018

Title:
Corrections of the NIST Statistical Test Suite for Randomness

Authors: Song-Ju Kim, Ken Umeno, Akio Hasegawa

Abstract:

It is well known that the NIST statistical test suite was used for the
evaluation of AES candidate algorithms.
We have found that the test setting of Discrete Fourier Transform test and Lempel-Ziv test of this test suite are wrong.
We give four corrections of mistakes in the test settings.
This suggests that re-evaluation of the test results should be needed.

ePrint: https://eprint.iacr.org/2004/018

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